AC coupled interconnect test using a peak detector
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چکیده
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منابع مشابه
Accurate In Situ Measurement of Peak Noise and Delay Change Induced by Interconnect Coupling
An accurate in situ noise and delay measurement technique that considers interconnect coupling effects is presented. This paper improves upon previous work by proposing 1) a novel accurate peak detector to measure on-chip crosstalk noise, and 2) in situ measurement structure to characterize the dynamic delay effect. A test chip was fabricated using 0.35m process and measured results demonstrate...
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